Category: Events

In Hall 6, Booth 6-410, we present open-frame power modules with embedded M-Shunts soldered directly into the circuit.

The unsealed, open-housing design gives a clear view of the M-Shunt integration and illustrates our Kelvin Source measurement approach in a real module environment. This demonstration highlights how the M-Shunt enables precise, low-inductance current sensing without compromising the switching performance of the module.

For a detailed explanation of the underlying measurement principle, visit the Kelvin Source technology page on our website.

In Hall 6, Booth 6-419, we share a joint booth with the University of Bremen’s HiPE-Lab and IB-Billmann — our home booth at PCIM 2026.

Stop by for a conversation about the latest M-Shunt developments, current measurement challenges, or anything power electronics. We are happy to discuss your specific application and explore whether and how the M-Shunt fits your measurement needs.

Our partners from HiPE-Lab present their capabilities for design, simulation, and testing of power electronic systems under realistic environmental and electrical conditions — covering the full range from early-stage development through to system-level validation.

In Hall 7, Booth 157, we present a double pulse test setup with M-Shunts integrated into the load path of a module measurement.

The system is measured using the FireFly probe from PMK Mess- und Kommunikationstechnik GmbH and controlled via a Cleverscope oscilloscope, which also provides an optically isolated input stage.

This setup demonstrates high-bandwidth current measurement under realistic switching conditions

In Hall 7, Booth 7-100, we demonstrate a double pulse test of discrete SiC MOSFETs in a dedicated setup at the Rohde & Schwarz booth.

The Mini M-Shunt and Diamond M-Shunt are used side by side to compare measurement performance under fast transient switching conditions — giving a direct, practical impression of how shunt geometry affects bandwidth and signal quality.

This setup builds on our ongoing collaboration with Rohde & Schwarz. In May 2026, Hauke Lutzen joined their Power Electronics Online Conference as an invited speaker — presenting insights into high-bandwidth current measurement and advanced sensor technologies for fast-switching applications. Read the full recap on our website.

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