M-Shunt will be exhibiting together with Rohde & Schwarz at electronica 2026 in Munich.
Precise current transient measurement is one of the key challenges in high-frequency power electronics testing. At this year’s event, we will showcase a live Double Pulse Test (DPT) setup demonstrating high-bandwidth current characterisation for wide-bandgap devices such as GaN and SiC.
Rohde & Schwarz Booth: Hall A4, Booth 307
Visit us at the Rohde & Schwarz booth to see the setup in action and discuss your current measurement challenges with Vladimir and Hauke.
If you would like to discuss a specific application in more detail, feel free to schedule a meeting with us at electronica.
