Detection of Bond Wire Lift-Off Using Machine Learning on Switching Waveforms of Two ParalleledSiC-MOSFETs

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K. Idei, J. Müller, H. Lutzen, S. Nishizawa, N. Kaminski and Wataru Saito

ESREF – European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Wien, Austria

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