At PCIM, the M-Shunt is showcased across multiple booths, demonstrating real-world current measurement in modern power electronics applications.
From double pulse testing to system-level validation, we present different setups highlighting the performance of the M-Shunt in fast-switching environments.
On the Monday before the fair, Hauke Lutzen will be speaking at a full-day tutorial on power semiconductor characterisation — covering WBG fundamentals in the morning and switching loss measurements in the afternoon. More information and registration.
Also presented at PCIM: the paper “Detecting Asymmetries within Multi-Chip SiC Power Modules by Means of the Kelvin Source” by J. Müller, H. Lutzen, T. Buchholz, J.-H. Peters, W. Saito and N. Kaminski. Read more.