J. Müller, H. Lutzen, T. Buchholz, J.H. Peters, W. Saito and N. Kaminski
in ISPSD 2026 – IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD), Las Vegas, USA
Detecting Asymmetries within Multi-Chip SiC Power Modules by Means of the Kelvin Source
Published: