Impact of Bond Wire Lift-Off on the Switching Transients of SiC-MOSFETs –Kelvin-Source Currents as Potential Indicator of Degradation

Published:

J. Müller, H. Lutzen, M. B. Çoruk, W. Saito and N. Kaminski

2025 17th International Seminar on Power Semiconductors (ISPS), Prague, Czech Republic, 2025

IEEE Xplore